CVE-2025-9709
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Inje
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
EPSS 0.0004
Monitor
- No active-exploitation, high-EPSS, or public-exploit signals - routine patching cadence
Sigma rules0
YARA rules0